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SURFACE PARTICLE COUNTING SYSTEMS
SISTEMA SSP & SSP NOVA SCANNING PROBE SERIES FOR OPCS
1. WHY SURFACE PARTICULATE DETECTION?
In many branches of industry the manufacture of an ultraclean surface is crucial to the functionality and quality of the product. Particles have an impact on the overall effectiveness of process equipment, decreasing tool availability and increasing defects, reject rates and costs. Therefore avoiding particles on surfaces is an essential task of an effective quality assurance. The question is how to obtain reliable data giving evidence of the cleanliness of critical parts, work surface and process equipment etc.?
2. THE SOLUTION – SISTEMA SURFACE SCAN PROBES HOOKED UP TO ORDINARY APCS
With Sistema Surface Scan Systems the user can instantly assess the cleanliness of critical surfaces (e. g. supply chain QA) and the effectiveness of cleaning procedures. Its unique technology and portable design makes Sistema Surface Scan Systems the perfect tool Companies concerned with surface cleanliness.
3. BENEFITS OF SISTEMA SURFACE SCAN SYSTEMS
- Inspection of cleanliness before and after cleaning processes (work pieces, tools, equipment, cleanrooms, etc.).
- Qualification of processes
- Cleanliness qualification of incoming and outgoing materials
- Reduction of down times (e. g. maintenance circles)
- Reduction of defect and reject rates and hence increase of productivity
4. MAJOR PROS OF SISTEMA SURFACE SCAN SYSTEMS
- ONLINE I DIRECT I RAPID
- Making the standard Solair airborne particle counter a DOUBLE USE SYSTEM1 airborne & surface particle counter
- Available for MULTIPLE AIRFLOWS (1 CFM | 2 CFM)
- NON DESTRUCTIVE
- Eliminating human error sources
- Ionization unit as accessory available
1) except Boulder (only SPC)